JPH0551843B2 - - Google Patents

Info

Publication number
JPH0551843B2
JPH0551843B2 JP58106673A JP10667383A JPH0551843B2 JP H0551843 B2 JPH0551843 B2 JP H0551843B2 JP 58106673 A JP58106673 A JP 58106673A JP 10667383 A JP10667383 A JP 10667383A JP H0551843 B2 JPH0551843 B2 JP H0551843B2
Authority
JP
Japan
Prior art keywords
value
difference signal
memory
scanning
stored
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58106673A
Other languages
English (en)
Japanese (ja)
Other versions
JPS606805A (ja
Inventor
Tsutomu Tachibana
Yasuhide Nakai
Manabu Nakatsuka
Yutaka Yoshima
Shigenori Nakajima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP58106673A priority Critical patent/JPS606805A/ja
Publication of JPS606805A publication Critical patent/JPS606805A/ja
Publication of JPH0551843B2 publication Critical patent/JPH0551843B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP58106673A 1983-06-16 1983-06-16 光学的エツジ位置検出方法 Granted JPS606805A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58106673A JPS606805A (ja) 1983-06-16 1983-06-16 光学的エツジ位置検出方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58106673A JPS606805A (ja) 1983-06-16 1983-06-16 光学的エツジ位置検出方法

Publications (2)

Publication Number Publication Date
JPS606805A JPS606805A (ja) 1985-01-14
JPH0551843B2 true JPH0551843B2 (en]) 1993-08-03

Family

ID=14439587

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58106673A Granted JPS606805A (ja) 1983-06-16 1983-06-16 光学的エツジ位置検出方法

Country Status (1)

Country Link
JP (1) JPS606805A (en])

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6658629B2 (ja) * 2017-03-14 2020-03-04 Ｊｆｅスチール株式会社 高強度冷延鋼板のエッジ検出方法及びエッジ検出装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2507040B2 (de) * 1974-04-24 1977-03-03 Zygo Corp., Middlefield, Conn. (V.StA.) Optoelektronische messvorrichtung fuer die lage einer kontrastierenden kante eines gegenstandes

Also Published As

Publication number Publication date
JPS606805A (ja) 1985-01-14

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